Shipping high-quality ICs requires that design-for-test (DFT) methodologies be included in a design. DFT provides external access at the device’s I/O pins to internal registers to either control or ...
Bus-based packetized scan data decouples test delivery and core-level DFT requirements so core-level compression configuration can be defined completely independently of chip I/O limitations. Grouping ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...
Huge transistor counts, rising on-chip clock rates, relentlessly escalating levels of integration in systems-on-chip, and new types of defects seen in deep-submicron and nanometer processes are ...
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