Within analytical sciences, energy dispersive X-ray spectroscopy (otherwise known as EDS) and CL in the scanning electron microscope (termed SEM) are vital microanalysis techniques. During the process ...
The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...
Christopher J. Kiely, the Harold B. Chambers Senior Professor of Materials Science and Engineering at Lehigh University’s P.C. Rossin College of Engineering and Applied Science, has been elected as a ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results