The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...
Parallel test is a surefire method for speeding up production, and asynchronous parallel test has long been known as an effective way of significantly improving through-put while making the most of ...
Santa Rosa, CA. Keysight Technologies today announced the third generation of its P9000 Series massively parallel parametric test system. The system accelerates the fast ramp of new technology and ...
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