Electronics are getting more sophisticated and complex every day. Chips, boards, and the systems they comprise are increasingly difficult to design. Companies engaged in electronic product development ...

Logic built-in self-test (LBIST), is a mechanism that lets an (IC) test the integrity of its own digital logic structures. LBIST operates by stimulating the logic-based operations of the IC and then ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Test strategy analysis has become increasingly important for finding ways to reduce test costs for system-on-a-chip (SoC) semiconductor devices. Every SoC device’s test flow is unique and requires a ...