Atlantic City, NJ, (October 3, 2000) - Genesys Testware, Inc. today introduced the first commercial Built-In Self-Test, Diagnosis and Repair (BISTDR) for embedded memories with spare cells and repair ...
Atlantic City, NJ, (September 28, 1999) -- Genesys Testware, Inc. today announced the addition of multi-frequency built-in at-speed testing capability to its Logic BistCore TM product to reduce defect ...
Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Dany Lepage discusses the architectural ...
SAN FRANCISCO — Genesys Testware Inc. has added efficient automated insertion of embedded test and repair circuits for memory into system IC designs to it's ArraytestMaker product, the company said ...
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