Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Soroosh Khodami discusses why we aren't ready ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Fabien Deshayes discusses the strategies ...

To establish standardised protocols for vision screening, testability and comparability of three different vision tests were examined in a population-based, cross-sectional sample of preschool ...

The complexity of system-on-chip (SoC) designs continues to grow, so the corresponding design-for-test (DFT) logic required for manufacturing has become more advanced. Design teams are challenged by ...

JTAG has its place but it is not by any means the total solution. Boundary scan, as standardized by IEEE 1149.1 and commonly referred to as JTAG, has truly revolutionized the testability of circuit ...

Before you get into the details of a design, you can use a general technique to locate places at which added test points or components can increase testability. First, draw a diagram that includes the ...

The paper describes the design-for-test (DFT) features of a 10.3125Gb/s Serdes and other such high datarate IP as XAUI, PCIe, and others. It is shown that extensive testability can be implemented in a ...

Software has typically been developed with three primary considerations in mind: time to market, budget and functionality. The schedule rules, now more than ever; software has become a competitive ...