Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.

On-wafer probing techniques have become indispensable in the precise characterisation of semiconductor devices operating in the microwave and terahertz regions. These techniques enable the direct ...

Parallel piezo aligners with fly height sensors enable faster PIC wafer testing.

Seamlessly integrated system combines TITAN™ Probes and MPI's wafer-level expertise to unlock precision measurements for next-generation semiconductors and sub-THz applications This latest milestone ...

It took scientists just 0.9 megapascals of pressure to pierce a problem holding back the next wave of display technology. At Tianjin University, researchers have unveiled a groundbreaking method to ...

Probe Card for Wafer Testing Market A thorough analysis of statistics about the current as well as emerging trends offers clarity regarding the Probe Card for Wafer Testing Market dynamics. The report ...

Partially defective, marginal die can still be functional enough to pass final electrical test. Some of these “walking wounded” chips get past final testing, but in the customer’s end product, under ...

Probing solution is industry first to operate at bandwidths greater than 50 GHz with high-impedance probe head High-impedance, turnkey solution delivers bandwidths up to 52 GHz Brickwall and 40 GHz ...

Based on FormFactor's scalable MicroSpring interconnect technology, the PH150 probe card enables the testing of 300-mm DRAM wafers in just six touchdowns. The ability to test a wafer in fewer ...

Wafer-probing specialist Ardentec anticipates commencing operations at its new plant in Longtan, northern Taiwan, in the second quarter of 2025. Save my User ID and Password Some subscribers prefer to ...

Add Yahoo as a preferred source to see more of our stories on Google. It took scientists just 0.9 megapascals of pressure to pierce a problem holding back the next wave of display technology. At ...