For example, with the new types of device structure and higher performance, the required amount of parametric test data per advanced technology node (less than or equal to 20 nm) is drastically ...

A K-sample testing problem is studied for multivariate counting processes with time-dependent frailty. Asymptotic distributions and efficiency of a class of non-parametric test statistics are ...

This paper deals with non-parametric two-sample tests on dispersions. Two samples, X- and Y-samples of m and n independent observations from populations with continuous cumulative distribution ...

To address this challenge and enable manufacturers to quickly ramp capacity, Keysight has delivered the new P9002A parallel parametric test system, which offers cost-effective wafer test with high ...

Today’s devices are required to pass thousands of parametric tests prior to being shipped to customers. A key challenge test engineers face, in addition to optimizing the number of tests they run on ...