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Abstract: This article presents novel scan driver circuits for active-matrix display panels based on CMOS logic gates and hybrid thin-film transistor (TFT) technology. In the proposed design, the ...
Abstract: This paper presents a comprehensive Bias Temperature Instability (BTI)-induced aging and thermal management analysis framework, specifically designed for High-Voltage Indium Tungsten Oxide ...
This repo builds shiftleft/sast-scan, a container image that powers the ShiftLeft Scan product. Scan products are open-source under a GNU GPL 3.0 or later (GPL-3.0-or-later) license.
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