Workout Structure:** - 0:00 Introduction - 0:42 Round 1 - 7:55 Round 2 - 16:37 Round 3 DISCLAIMER: The exercises and workouts ...
Abstract: This paper presents a novel voltage-ramping (V-ramp) wafer-level electromigration (EM) testing method aimed at reducing testing time. The EM behavior of copper (Cu) metal lines with both ...